Make your programming and development effortless with per pin programmable digital cards and intuitive software. With its digital capabilities, the Medalist i1000D performs digital PCF/VCL library-based testing, Boundary Scan, and I2C/SPI serial programming on a simple, low-cost long-wired test fixture. Get better test coverage without increasing your test cost.

Digital Coverage

• The digital subsystem of the i1000D harnesses the simplicity and power from the industry-leading Medalist i3070 ICT, to give you the power to adjust test speeds, drive and receive voltages with just a few clicks of the mouse.

Complete Boundary Scan Capabilities

• Get more ICT power with full boundary scan capabilities, from Standard Boundary Scan and Connect Test to Interconnect Test.

Powerful Debug Interface

• The digital debug user interface leverages the control and flexibility of the legendary i3070 PushButton debug GUI, giving you full control of the digital test parameters and test source codes.

Low-Cost Fixturing

• The Medalist i1000D runs digital tests using a traditional MDA-style long wired press down fixture. Boundary Scan tests, Serial Programming, Library-based tests all run without a glitch. Users now have a test solution that is simple and effective, and at the same time keep their operational costs down with the MDA-style fixtures.

Keysight offers i3070 in-circuit test system rental services to help you with your short-term capacity needs. Our rental systems come configured with the latest hardware and software to ensure you have access to the latest technology.

This ICT rental agreement includes system calibration, cooperative support services and easy access to a suite of affordable support services to make you have peace of mind.

The Keysight Mini ICT provides ICT tests with other instruments with the following features:

• 5U 19 inch rack-mount form factor
• Complete analog ICT test features including VTEP v2.0
• Complete digital ICT test features including IEEE1149 boundary scan and Cover-Extend Technology
• True 1:1 per-pin programmable architecture with 500 mA driving capability
• Built-in DUT power supply control and complete discharge features
• SCPI support for VISA-based test sequencer
• Standalone and parallel in-circuit test

Maximize your test coverage by combining functional tests with In-circuit!

The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vector-less test, Cover-Extend Technology, to digital library tests and boundary-scan. The unmixed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in a functional test.

Standard instrument SCPI commands make it easy to work with other instruments and external test sequencers under IVI VISA architecture. A built-in program scripting tool makes the overall test execution even more flexible for your needs.

• Smallest foot print inline automated ICT – 850 mm
• Largest bottom side component clearance – 40 mm
• Upgradeable between inline and offline configurations
• Special mechanism for test access on the board edge
• Powerful digital test capabilities such as Boundary Scan, Cover-Extend Technology (CET), and Keysight’s well-known VTEP
• Integrated inline automated solution with Keysight’s worldwide support

Anticipating the cost dynamics in PCBA manufacturing, Keysight’s automated i1000D inline ICT helps you to accelerate production ramp up, while ensuring the quality of your products. Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop solution for automating your in-circuit test.

• Parallel test architecture
• True 4-up parallel, supporting heterogenous boards
• Enhanced to support combination of ICT and functional test
• A small foot print inline automated ICT – 850 mm
• Fits larger boards, with 40 mm bottom clearance
• Integrated inline automated solution with Keysight’s worldwide support

The enhanced Keysight Flexicore i1000 ICT system with parallel test capability addresses key increasing trends in manufacturing while retaining all previous features. With the increased depth and built-in instrument rack, it is ready to combine both ICT and functional test, all in one automated system.

Keysight’s Flexicore i1000 inline ICT helps you to accelerate production ramp up, while ensuring the quality of your products through some key unique features:

• Heterogenous panels in a board is easily addressed using the new parallel test architecture, easily configure 2/3/4 modules in parallel
• Flexibility to configure active modules for maximum productivity, with an increased node count to 2,560
• Fast change over, with automatic switching of test with hardware configuration loaded
• Repurpose as a combination or purposed ICT or functional tester, or an automated volume flashing station

With a robust mechanical handler design, ready with automated programmable conveyor width adjustment, pneumatic dual-stage press with a 1mm accuracy, and an optimized control environment optimized for parallel testing, the Keysight Flexicore is your answer to a one-in-all solution for your dynamically evolving and throughput intensive production lines.

In Circuit Board Tester for High Quality PCBA Testing

With current in-circuit tester on the market only support up to 4 cores in parallel, PCBA test engineers need to test and purchase more systems to meet manufacturing demands, which incurs scaling and infrastructure costs, a bigger footprint and additional labor for support and maintenance.

Keysight’s i7090 new massively parallel board test system supports up to 20 In-Circuit Test cores in parallel with PCI eXtensions for Instrumentation (PXI) based in-circuit test capability. Therefore, core configuration is variable and not confined to a fixed number of rows, which reduces overall computing costs. To expand functionality, Keysight OpenTAP support enables open platforms for the integration of hardware. As needed and with extensible instrumentation and pin cards, users can easily scale resources.

New i7090 Features and Benefits:

• 20 parallel cores deliver flexible scalability and configuration, as well as the ability to perform tests on multiple Unit Under Tests (UUTs).
• A small system footprint, 600 mm in width, saves space and cycle time.
• High to ultra high-volume manufacturing reduces system investment and supports production test times as needed.
• Includes unpowered and vectorless test extended performance (nanoVTEP) technologies for component test to gain the benefits of faster test throughput, lower cost fixtures and higher fault coverage.
• Instrument integration with Keysight OpenTAP software, within the same platform, for efficient functional test measurements and PXI support for Keysight and 3rd party instruments.
• Supports multi-platform hardware in a standard 48 cm rack for functional integration.
• Programming function integration provides in-system programming with 160 channels in parallel, increasing system throughput.

i7090 is infused with state-of-the-art Industry 4.0 automation and analytics to deliver unparalleled capability that can be optimized for a broad variety of high-volume PCB assembly manufacturing challenges.

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50 spring clips

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 10, 2.5”/63.3mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 10, 12mm x 152mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 20, 1.2”/30.5mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50, 0.4”/10mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 20, 4mm x 6.65mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50, 0.16”/4mm Sensor Plate
SMD Snap-fit socket
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50 nanoVTEP amplifiers
Pre-assembled and replaceable
No soldering required

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 100 nanoVTEP probes
Comes with amplifier, barrel, spring clip and receptacle
Suitable for testing devices that are 10mm or smaller
Increased test coverage and fault detection with miniaturized test probe that overcome placement challenges in high density fixtures

x1149 Boundary Scan Analyzer - Versatile yet Easy to use Board Test  Tool

Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing. Offering an intuitive interface, the analyzer makes all information easily available on the screen with one mouse click. 

Highlight

• Best-in-class User Interface
• Parallel testing of memories
• Voltage monitoring
• Excellent Signal Quality

NPI Features

• Design For Test Analysis
• Test Point Reduction (TPR) Report
• Multi chain generation

Test Development

• Maximize test coverage on connectors and non-boundary scan ICs
• Excellent debug tools
• Actionable pin-level failure reporting
• In-system Programming

Applications

• Excellent Test Coverage for Netcom and Server Products
• IEEE 1687 Solution for Board Test
• Automated Configuration of Scan Path Linkers

The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.

Additionally, x1149 programs PROM (Programmable Read-Only Memory) devices as well as execute memory verification tests on devices such as DDR SDRAMs (Double Data Rate Synchronous Dynamic Random-Access Memory).

Being fully compliant to the IEEE 1149.1 Boundary Scan standard, the x1149 can provide test coverage for much of a PCBA with boundary scan devices. In addition to that, the innovative Cover-Extend Technology enables test coverage to go beyond just IEEE 1149.1 devices - to also include connectors, sockets and non IEEE1149.1 device. Keysight x1149 also supports the IEEE 1149.6 standard for AC-coupled bus lines.

With an in-built scan chain linker, it can join multiple scan chains to maximize the coverage on the interconnect nodes between boundary scan devices.

And now IEEE 1687 standard is supported in Keysight x1149 boundary scan analyzer.

• Max node count : 5184
• Max channel count : 1152
• Footprint : 2.4 m x 0.8 m / 7.8’ x 2.6’
• Max no of modules : 4

The E9903E i307x Series 5 has the largest nodes count coverage of the i3070 Series 5 family at 5184 nodes. The system includes the same Ease of use GUI on its predecessor, the E9903D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today’s components.

All i3070 Series 5 tests systems include a new infrastructure for more flexibility in the addition, control and connection of external electronics or instruments. The system allows external electronics to be plugged into the testhead as if it has been merged into the system. The external electronics can be functional test circuits to provide additional functional test coverage at ICT, or provide additional stimulus to the unit under test for better test coverage. Control of the external electronics, test sequence and test results are still through the BT-BASIC testplan, executed by the testhead PC Controller that our users are familiar with.

PCBAs today have higher current requirements in order to power their increased functionalities. It is now possible to pump 10 A into the unit under test through the tester. The power supply port can also be multiplexed so that one power supply can power up to 6 different boards in a panel. Each power channel is controlled by a relay so that the unit under test is protected.

The i3070 Series 5 test system includes a new Analog Stimulus and Measurement Unit (ASRU) that can boost the analog test speeds by 20%, thus increasing the throughput of the units under test.

The limited test access test tools found in previous revision of the test system is available here.

If you have large boards that you want to test quicker with better test coverage, the E9903E i307x Series 5 system is for you.

Read more about the i3070 Series 5 here.

All Medalist i3070 test systems are able to accept both Mux pin cards as well as UnMux pin cards. This is to provide you more flexibility in the use of this system.

** Total pin cards cannot exceed 9 pin cards/module

To learn more, request additional product information.

For more information about ict systems, please visit ICT System - i3070.

• Max node count : 2592
• Max channel count : 576
• Footprint : 1.8 m x 0.8 m / 5.8’ x 2.6’
• Max no of modules : 2

The E9902E i317x Series 5 system offers is designed to meet the needs of most mainstream electronics manufacturers seeking not only in-circuit test capability but additional test capability to ensure the highest test coverage for PCBAs. A two module option of the i3070 ideal for customers who require less node count capability.

All i3070 Series 5 tests systems include a new infrastructure for more flexibility in the addition, control and connection of external electronics or instruments. The system allows external electronics to be plugged into the testhead as if it has been merged into the system. The external electronics can be functional test circuits to provide additional functional test coverage at ICT, or provide additional stimulus to the unit under test for better test coverage. Control of the external electronics, test sequence and test results are still through the BT-BASIC testplan, executed by the testhead PC Controller that our users are familiar with.

PCBAs today have higher current requirements in order to power their increased functionalities. It is now possible to pump 10 A into the unit under test through the tester. The power supply port can also be multiplexed so that one power supply can power up to 6 different boards in a panel. Each power channel is controlled by a relay so that the unit under test is protected.

The i3070 Series 5 test system includes a new Analog Stimulus and Measurement Unit (ASRU) that can boost the analog test speeds by 20%, thus increasing the throughput of the units under test.

The limited test access test tools found in previous revision of the test system is available here.

If you have large boards that you want to test quicker with better test coverage, the E9903E i307x Series 5 system is for you.

Read more about the i3070 Series 5 here.

All Medalist i3070 test systems are able to accept both Mux pin cards as well as UnMux pin cards. This is to provide you more flexibility in the use of this system.

** Total pin cards cannot exceed 9 pin cards/module

To learn more, request additional product information.

For more information about ict systems, please visit ICT System - i3070.

• short-wire fixturing technology ensures transportability, repeatability and stability
• can handle large board sizes, up to 28 in x 24 in
• innovative design ensures easy maintenance and fixture change
• single point of contact for your automated in-circuit test (ICT) solution
• comprehensive in-system suite of boundary scan tools
• full suite of award-winning Keysight ICT solutions

The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in the Keysight 3070 and i3070 systems.

Short-wire fixture technology eliminates problems commonly found with long-wire fixturing such as noise and deterioration of test stability. This translates into transportable, repeatable, and stable tests on your i3070 Series 5i even if you need to deploy tests halfway across the globe or on different manufacturing sites.

The i3070 Series 5i Inline ICT brings ease of use to the busy line operator and test engineer. All instruments are accessible via the front for easy maintenance.

An array of tools including intelligent fixture identification, board orientation detection, and test plan revision controls are available to help you develop best-in-class automation solutions for testing today’s complex printed circuit board assemblies.

The i3070 Series 5i is fully backward compatible with 3070 and i3070 test programs.

For more information about ICT systems, please visit ICT System - i3070.

• Short-wire fixturing technology ensures transportability, repeatability and stability
• Innovative design ensures easy maintenance and fixture change
• Compact chassis, only 800 mm or 31.5” in length 
• Single point of contact for your automated ICT solution
• Comprehensive in-system suite of boundary scan tools

The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.

Short wire fixture technology eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.

The i3070 Series 5i Inline ICT brings ease of use to the busy line operator and test engineer. The card cage is mounted on heavy-duty slides, and can be easily pulled out to facilitate replacement of module cards.

An ergonomically designed drawer unit enables fixtures to be easily loaded onto or unloaded from the test system. These features save both time and effort, especially for lines running a higher mix of products.

An array of tools like intelligent fixture identification, board orientation detection and test plan revision controls are available to help you develop best-in-class automation solutions for testing today’s complex printed circuit board assemblies.

The i3070 Series 5i is fully backward compatible with your 3070 and i3070 test programs.

For more information about ict systems, please visit ICT System - i3070.

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.