DESCRIPTION

KEY FEATURES

• High-speed analog test time of 0.6 ms (at 1 MHz)
• Improved noise resistance and enhanced repeatability in measurement precision even for production lines
• 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines
• BIN function, for easy component screening

DESCRIPTION

KEY FEATURES

• SMD TEST FIXTURE exclusively for the IM7580 series
• 2 device guides let you measure 6 different SMD sizes
• Definitive 3GHz high frequency analysis made easy
• Supports SMD sizes (EIA) 0201, 0402, 0603, 0805, 1206, and 1210

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from DC to 3 GHz devices to suit a wide range of applications in the testing of electronic components. The IM9202 Test Fixture supports high frequency testing up to 600 MHz when paired with the IM7850 Impedance Analyzer series, and delivers a unique staging mechanism that lets you validate components and devices in various shapes and sizes, including RFID and NFC chips.

Key Features

• Test fixture for IMPEDANCE ANALYZER IM7580 Series
• High frequency testing up to 600 MHz
• Test the impedance of devices in a diverse range of shapes and sizes, including leaded/though-hole devices, SMD, and RFID and NFC chips
• Aids in properly identifying self-resonance frequency (SRF) and equivalent series resistance (ESR) to validate component performance

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7587 Impedance Analyzer offers a top measurement time of 0.5ms over a 1MHz to 3GHz frequency range and superior stability, making it ideal for R&D as well as high volume production of ferrite chip beads and chip inductors.

KEY FEATURES

• 1 MHz to 3 GHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• 0.07% measured value variability (When measuring a 1 nH coil at 3 GHz)
• ±0.65% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7585 Impedance Analyzer offers a top measurement time of 0.5ms over a 1MHz to 1.3GHz frequency range and superior stability, making it ideal for R&D as well as high volume production of ferrite chip beads and chip inductors.

KEY FEATURES

• 1 MHz to 1.3 GHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• 0.07% measured value variability (when measuring at 1GHz)
• ±0.65% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7583 offers a top measurement time of 0.5ms over a 1MHz to 600MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.

KEY FEATURES

• 1 MHz to 600 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.65% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.

KEY FEATURES

• 100 kHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.72% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7580A impedance analyzer offers a top measurement time of 0.5ms over a 1MHz to 300MHz frequency, and both LCR and Analyzer Modes to meet applications for both high volume production inspections and research and development.

KEY FEATURES

• 1 MHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec
• ±0.72% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM3570 is ideal for use in applications requiring low-ESR measurement on the order of several milliohms, for example testing of functional polymer capacitors, due to its superior low-impedance repeatability.

Key Features
• LCR measurement, DCR measurement, sweep measurement, continuous measurement and high-speed testing achieved with one instrument
• High-speed testing, achieving maximum speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode
• High-accuracy measurements, basic accuracy of Z parameter: ± 0.08%
• Perfect impedance analyzer for testing the resonance characteristics of piezoelectric elements, C-D and low ESR measurement of functional polymer capacitors, DCR and L-Q measurement of inductors (coils and transformers)
• Perform frequency sweeps, level sweeps, and time interval measurements in analyzer mode
 

IMPEDANCE ANALYZER IM3570: MEASURING THE RESONANCE CHARACTERISTICS OF A PIEZOELECTRIC ELEMENT

The IM3570, which serves as both an LCR meter and an impedance analyzer, can generate pass/fail judgments on the resonance condition using its frequency sweep measurement and peak comparator functions, and also conduct continuous inspections under different conditions including pass/fail decisions via 1 kHz and 120 Hz LCR testing. In this way, it is possible to make both frequency sweep measurement and LCR measurement with a single instrument.

DESCRIPTION

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components.. The IM3590 impedance analyzer is an advanced component tester especially suited to electrochemical impedance measurements and includes a variety of graphing functions that are needed for battery and chemical material testing.

KEY FEATURES

• Broad 1 mHz to 200 kHz signal source range supports measurements of ion behavior and solution resistance
• Continuous measuring and high-speed testing of LCR and sweep measurements with a single instrument
• Measure internal impedance of batteries with no load
• Perform high-speed sweep measurements in as little as 2 ms
• Basic accuracy of ±0.05% is ideal for applications from component testing to R&D
• Measure LCR impedance for Cole-Cole plots and equivalent-circuit analyses of electro-chemical components and materials