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19, Jalan PJS 3/59,
Taman Sri Manja,
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Selangor, Malaysia.

+603-7783 2257
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+603-7783 4318

In-circuit Test Selangor, Malaysia, Kuala Lumpur (KL), Petaling Jaya (PJ)

KEYSIGHT U9403A Mini In-Circuit Test System

Product Details

Keysight U9403A Mini ICT provides full ICT features like VTEP, Boundary Scan, and DUT power control in a 5U form factor. Runs standalone or parallel with internal or external sequencers. Easy functional test integration with SCPI support.


The Keysight Mini ICT provides ICT tests with other instruments with the following features:

  • 5U 19 inch rack-mount form factor
  • Complete analog ICT test features including VTEP v2.0
  • Complete digital ICT test features including IEEE1149 boundary scan and Cover-Extend Technology
  • True 1:1 per-pin programmable architecture with 500 mA driving capability
  • Built-in DUT power supply control and complete discharge features
  • SCPI support for VISA-based test sequencer
  • Standalone and parallel in-circuit test

Maximize your test coverage by combining functional tests with In-circuit!

The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vector-less test, Cover-Extend Technology, to digital library tests and boundary-scan. The unmixed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in a functional test.

Standard instrument SCPI commands make it easy to work with other instruments and external test sequencers under IVI VISA architecture. A built-in program scripting tool makes the overall test execution even more flexible for your needs.

KEYSIGHT N4344A NanoVTEP Spring Chip, Pack of 50

Product Details

NanoVTEP Spring Clip, pack of 50

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50 spring clips

KEYSIGHT N4341A NanoVTEP Sensor Plate, 2.5 inches/63.3mm, Pack of 10

Product Details

Sensor plate for nanoVTEP application, suitable for testing device geometry up to 2.5”/63.3mm in size.

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 10, 2.5”/63.3mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4342A NanoVTEP sensor plate, 12.5mm X 152mm, Pack of 10

Product Details

Sensor plate for nanoVTEP application, suitable for testing device geometry up to 12mm x 152mm in size.

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 10, 12mm x 152mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4340A NanoVTEP Sensor Plate, 1.2 inches/30.5mm, acPk of 20

Product Details

Sensor plate for nanoVTEP application, suitable for testing device geometry up to 1.2”/30.5mm in size.

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 20, 1.2”/30.5mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4339A NanoVTEP Sensor Plate, Single Probe, 0.4 inches/10mm, Pack of 50

Product Details

Sensor plate for nanoVTEP application, suitable for testing device geometry up to 0.4”/10mm in size.

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50, 0.4”/10mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4338ANanoVTEP Sensor Plate, Single probe, 4mmx6.65mm, Tant. C/D, Pack of 20

Product Details

Sensor plate for nanoVTEP application, 4mm x 6.65mm, suitable for testing tantalum chip size C/D

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 20, 4mm x 6.65mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4337A NanoVTEP Sensor Plate, Single Probe, 0.16 inches/4mm, pack of 50

Product Details

Smallest sensor plate for nanoVTEP application in high density fixture, 0.16” x 064mm x 4mm


  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 50, 0.16”/4mm Sensor Plate
SMD Snap-fit socket
No soldering required

KEYSIGHT N4336A NanoVTEP Amplifier

Product Details

Miniaturized nanoVTEP amplifier for vectorless testing, designed to be assembled with various sensor plate sizes without the need to perform additional soldering.


  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.


Key Features & Specifications

Quantity of 50 nanoVTEP amplifiers
Pre-assembled and replaceable
No soldering required

KEYSIGHT N4335A NanoVTEP, full assembly with receptacle, Pack of 100

Product Details

With a smaller physical profile, nanoVTEP enables greater opportunity for vectorless test implementation on high density boards when fixture clearance is a premium. The amplifier is placed ideally above the device under test, providing a shorter signal path for better signal measurement with less distortion.


  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 100 nanoVTEP probes
Comes with amplifier, barrel, spring clip and receptacle
Suitable for testing devices that are 10mm or smaller
Increased test coverage and fault detection with miniaturized test probe that overcome placement challenges in high density fixtures

KEYSIGHT N4334B nanoVTEP Signal Conditioner Card

Product Details

Each nanoVTEP probe is wired to a port on a Signal Conditioner Card (mux card) with two wires, a signal and a ground. The mux card improves the signal quality and reduces the number of test resources required.

Key Features & Specifications

Quantity of 1 nanoVTEP Signal Conditioner Card
Connects up to 64 nanoVTEP probes

KEYSIGHT x1149 Boundary Scan Analyzer

Product Details

Electrical structural test and programming tool based on IEEE 1149.x standards for boundary scan / JTAG technology.


x1149 Boundary Scan Analyzer - Versatile yet Easy to use Board Test  Tool

Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing. Offering an intuitive interface, the analyzer makes all information easily available on the screen with one mouse click. 

Highlight

  • Best-in-class User Interface
  • Parallel testing of memories
  • Voltage monitoring
  • Excellent Signal Quality

NPI Features

  • Design For Test Analysis
  • Test Point Reduction (TPR) Report
  • Multi chain generation

Test Development

  • Maximize test coverage on connectors and non-boundary scan ICs
  • Excellent debug tools
  • Actionable pin-level failure reporting
  • In-system Programming

Applications

  • Excellent Test Coverage for Netcom and Server Products
  • IEEE 1687 Solution for Board Test
  • Automated Configuration of Scan Path Linkers

The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.

Additionally, x1149 programs PROM (Programmable Read-Only Memory) devices as well as execute memory verification tests on devices such as DDR SDRAMs (Double Data Rate Synchronous Dynamic Random-Access Memory).

Being fully compliant to the IEEE 1149.1 Boundary Scan standard, the x1149 can provide test coverage for much of a PCBA with boundary scan devices. In addition to that, the innovative Cover-Extend Technology enables test coverage to go beyond just IEEE 1149.1 devices - to also include connectors, sockets and non IEEE1149.1 device. Keysight x1149 also supports the IEEE 1149.6 standard for AC-coupled bus lines.

With an in-built scan chain linker, it can join multiple scan chains to maximize the coverage on the interconnect nodes between boundary scan devices.

And now IEEE 1687 standard is supported in Keysight x1149 boundary scan analyzer.


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