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KEYSIGHT U9403A Mini In-Circuit Test SystemProduct Details Keysight U9403A Mini ICT provides full ICT features like VTEP, Boundary Scan, and DUT power control in a 5U form factor. Runs standalone or parallel with internal or external sequencers. Easy functional test integration with SCPI support. The Keysight Mini ICT provides ICT tests with other instruments with the following features:
Maximize your test coverage by combining functional tests with In-circuit! The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vector-less test, Cover-Extend Technology, to digital library tests and boundary-scan. The unmixed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in a functional test. Standard instrument SCPI commands make it easy to work with other instruments and external test sequencers under IVI VISA architecture. A built-in program scripting tool makes the overall test execution even more flexible for your needs. | KEYSIGHT N4344A NanoVTEP Spring Chip, Pack of 50Product Details NanoVTEP Spring Clip, pack of 50
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications Quantity of 50 spring clips | KEYSIGHT N4341A NanoVTEP Sensor Plate, 2.5 inches/63.3mm, Pack of 10Product Details Sensor plate for nanoVTEP application, suitable for testing device geometry up to 2.5”/63.3mm in size.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
Quantity of 10, 2.5”/63.3mm Sensor Plate | KEYSIGHT N4342A NanoVTEP sensor plate, 12.5mm X 152mm, Pack of 10Product Details Sensor plate for nanoVTEP application, suitable for testing device geometry up to 12mm x 152mm in size.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
Quantity of 10, 12mm x 152mm Sensor Plate |
KEYSIGHT N4340A NanoVTEP Sensor Plate, 1.2 inches/30.5mm, acPk of 20Product Details Sensor plate for nanoVTEP application, suitable for testing device geometry up to 1.2”/30.5mm in size.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
Quantity of 20, 1.2”/30.5mm Sensor Plate | KEYSIGHT N4339A NanoVTEP Sensor Plate, Single Probe, 0.4 inches/10mm, Pack of 50Product Details Sensor plate for nanoVTEP application, suitable for testing device geometry up to 0.4”/10mm in size.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications | KEYSIGHT N4338ANanoVTEP Sensor Plate, Single probe, 4mmx6.65mm, Tant. C/D, Pack of 20Product Details Sensor plate for nanoVTEP application, 4mm x 6.65mm, suitable for testing tantalum chip size C/D
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications | KEYSIGHT N4337A NanoVTEP Sensor Plate, Single Probe, 0.16 inches/4mm, pack of 50Product Details Smallest sensor plate for nanoVTEP application in high density fixture, 0.16” x 064mm x 4mm
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
Quantity of 50, 0.16”/4mm Sensor Plate |
KEYSIGHT N4336A NanoVTEP AmplifierProduct Details Miniaturized nanoVTEP amplifier for vectorless testing, designed to be assembled with various sensor plate sizes without the need to perform additional soldering.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
| KEYSIGHT N4335A NanoVTEP, full assembly with receptacle, Pack of 100Product Details With a smaller physical profile, nanoVTEP enables greater opportunity for vectorless test implementation on high density boards when fixture clearance is a premium. The amplifier is placed ideally above the device under test, providing a shorter signal path for better signal measurement with less distortion.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications | KEYSIGHT N4334B nanoVTEP Signal Conditioner CardProduct Details Each nanoVTEP probe is wired to a port on a Signal Conditioner Card (mux card) with two wires, a signal and a ground. The mux card improves the signal quality and reduces the number of test resources required. Key Features & Specifications Quantity of 1 nanoVTEP Signal Conditioner Card Connects up to 64 nanoVTEP probes | KEYSIGHT x1149 Boundary Scan AnalyzerProduct Details Electrical structural test and programming tool based on IEEE 1149.x standards for boundary scan / JTAG technology. x1149 Boundary Scan Analyzer - Versatile yet Easy to use Board Test ToolBoundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing. Offering an intuitive interface, the analyzer makes all information easily available on the screen with one mouse click. Highlight
NPI Features
Test Development
Applications
The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs. Additionally, x1149 programs PROM (Programmable Read-Only Memory) devices as well as execute memory verification tests on devices such as DDR SDRAMs (Double Data Rate Synchronous Dynamic Random-Access Memory). Being fully compliant to the IEEE 1149.1 Boundary Scan standard, the x1149 can provide test coverage for much of a PCBA with boundary scan devices. In addition to that, the innovative Cover-Extend Technology enables test coverage to go beyond just IEEE 1149.1 devices - to also include connectors, sockets and non IEEE1149.1 device. Keysight x1149 also supports the IEEE 1149.6 standard for AC-coupled bus lines. With an in-built scan chain linker, it can join multiple scan chains to maximize the coverage on the interconnect nodes between boundary scan devices. And now IEEE 1687 standard is supported in Keysight x1149 boundary scan analyzer. |